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About this product
Product Information
A thorough and in-depth preparation guide for PMP(R) and CAPM(R) exams covering Precedence Diagramming Method/Activity-On-Node concepts and their analysis using Critical Path Method. This guide explains the concepts with illustrated examples with emphasis on special situations. Explanation of concepts through stepwise solved examples will provide readers hands-on ability for their application. This guide will serve as a launch pad for advanced study in this area beyond the requirements of the two exams.Product Identifiers
PublisherBooklocker INC International Concepts concepts.,US
ISBN-139781614345046
eBay Product ID (ePID)111935782
Product Key Features
Number of Pages118 Pages
Publication NamePmp (R) /Capm (R) Exam Prep: a Basic Guide to Activity-On-Node and Critical Path Method
LanguageEnglish
SubjectWriting & Reading, Management
Publication Year2011
TypeReference
AuthorJayanta K. Das Purkayastha
FormatPaperback
Dimensions
Item Height254 mm
Item Weight220 g
Item Width178 mm
Additional Product Features
Country/Region of ManufactureUnited States
Title_AuthorJayanta K. Das Purkayastha
